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Lateral and vertical ordering in multilayered self-organized InGaAs quantum dots studied by high resolution x-ray diffraction

Identifieur interne : 001051 ( Russie/Analysis ); précédent : 001050; suivant : 001052

Lateral and vertical ordering in multilayered self-organized InGaAs quantum dots studied by high resolution x-ray diffraction

Auteurs : RBID : Pascal:97-0556935

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Abstract

We have studied multiple layers of self-organized InGaAs-islands grown on GaAs by x-ray diffraction reciprocal space mapping. We found an anisotropy of the dot spacing in [100] and [110] direction consistent with an ordering of the dots in a two-dimensional square lattice with main axes along the [100] direction and a lattice parameter of 55 nm. The nearly perfect vertical alignment (stacking) of the dots was deduced from the diffraction peak shape. © 1997 American Institute of Physics.

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